The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD  models  feature LD Plan BD objectives  with  a  superb  imaging performance, mounted on a 5-fold nosepiece.
The light intensity for each objective position is automatically memorized and will be repeated once the objective is swung in again. A compact Epi illuminator  carries a slot for polarizer and rotatable analyzer, ready for a Polarization  contrast and to reduce  internal  reflections.
** Due to a wide variety of options, these systems are very custom.  Please contact us for a quote**